Question

帮忙翻译成英文？专业点的

根据文献1所提出的陷阱电荷的实验测量方法，本文对此进行了推广和改进，给出了MIS结构的绝缘层中被电子占据的陷阱总量、恒流应力下新生陷阱的分布和总量以及栅介质材料中近似的陷阱总量

Answer 1

The experiment according to document electric charge brought forward by 1 measures method, distribution the main body of a book having been carried out on here being extended and being improving , having given trap all quantity , constant current strain being occupied by the electron in architectural insulating barrier of MIS out the down newborn trap's and all quantity and bars medium material middle similar trap all quantity

Answer 2

According to the literature 1 charge of experimental measurement trap, this paper improve and generalize MIS structure is presented, the layer of the amount by electrons occupying the trap, constant-current stress distribution under the new trap and the amount and the gate of dielectric material similar pitfalls

Answer 3

According to the trap of an experimental charge measurement method, this paper carried out the promotion and improvement of MIS structure gives the insulation layer of the trap occupied by electron total new trap under constant stress distribution and the total as well as the gate dielectric material similar to the trap of the total.

Answer 4

According to the trap of an experimental charge measurement method, this paper carried out the promotion and improvement of MIS structure gives the insulation layer of the trap occupied by electron total new trap under constant stress distribution and the total as well as the gate dielectric material similar to the total trap